Time

Topic

Speaker

9:00-12:00

May 19,2015

1. Scanning techniques for the analysis of system level EMC and ESD problems

2. Oscilloscope and spectrum analyzer – advanced topics for EMC

David Pommerenke,

USA

13:30-16:30

May 19,2015

1. ESD physics and its relationship to ESD testing

2. ESD system level failure analysis and design strategies for robust products

David Pommerenke,

USA

9:00-12:00

May 20,2015

1.overview and IEC HEMP environment standards

2. IEC HEMP testing standards

William Radasky,

USA

13:30-16:30

May 20,2015

1. IEC IEMI environment standards,

IEC IEMI testing standards

2. IEC IEMI protection standards,Discussion of new work in IEC SC 77C

William Radasky,

USA

9:00-12:00

May 21,2015

1.EMC development methodology applied in Industry

2.Modeling techniques fundamentals for EMC in Pspice

Frédéric Lafon,

France

13:30-16:30

May 21,2015

1.Examples and return on experience

2. Introduction to near field techniques

Frédéric Lafon,

France

9:00-12:00

May 22,2015

the mathematical techniques in EMC

Olivier MAURICE, France

13:30-16:30

May 22,2015

1. EMC design

2. EMC control plan

Olivier MAURICE, France